Measurement of broadband dielectric constant using substrate integrated waveguide

Chao Hsiung Tseng*, Tah Hsiung Chu

*此作品的通信作者

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

摘要

In this paper, a novel method to measure broadband dielectric constant using substrate integrated waveguide (SIW) is presented. Based on the transmission/reflection (T/R) method and multiline calibration procedures, two SIWs with different lengths are used to measure the dielectric constant of the substrate slab. The effective measurement frequency range covers the passband of the fundamental mode, TE10 mode, of the SIW. To verify the developed method, the SIWs are fabricated on Rogers RO4003 substrate and measured in Ka-band, 26-40GHz. The measured results are shown in good agreement with those using the ring resonator method. It demonstrates that the proposed method is an effective approach to characterizing the substrate slab in millimeter-wave range.

原文English
主出版物標題Proceedings of the 36th European Microwave Conference, EuMC 2006
發行者IEEE Computer Society
頁面392-394
頁數3
ISBN(列印)2960055160, 9782960055160
DOIs
出版狀態Published - 2006
事件36th European Microwave Conference, EuMC 2006 - Manchester, United Kingdom
持續時間: 10 9月 200612 9月 2006

出版系列

名字Proceedings of the 36th European Microwave Conference, EuMC 2006

Conference

Conference36th European Microwave Conference, EuMC 2006
國家/地區United Kingdom
城市Manchester
期間10/09/0612/09/06

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