Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics

Jaegoo Lee; Judy J. Cha; Sara C. Barron; David A. Muller; R. Bruce Van Dover; Ebenezer K. Amponsah; Tuo-Hung Hou; Hassan Raza; Edwin C. Kan

doi:10.1109/SOI.2008.4656284

Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics

Jaegoo Lee^*, Judy J. Cha, Sara C. Barron, David A. Muller, R. Bruce Van Dover, Ebenezer K. Amponsah, Tuo-Hung Hou, Hassan Raza, Edwin C. Kan

^*此作品的通信作者

研究成果: Conference contribution › 同行評審

2 引文斯高帕斯（Scopus）

原文	English
主出版物標題	2008 IEEE International SOI Conference Proceedings
頁面	39-40
頁數	2
DOIs	https://doi.org/10.1109/SOI.2008.4656284
出版狀態	Published - 24 12月 2008
事件	2008 IEEE International SOI Conference - New Paltz, NY, United States 持續時間: 6 10月 2008 → 9 10月 2008

出版系列

名字	Proceedings - IEEE International SOI Conference
ISSN（列印）	1078-621X

Conference

Conference	2008 IEEE International SOI Conference
國家/地區	United States
城市	New Paltz, NY
期間	6/10/08 → 9/10/08

存取文件

10.1109/SOI.2008.4656284

其它文件與鏈接

Link to publication in Scopus

引用此

Lee, J., Cha, J. J., Barron, S. C., Muller, D. A., Van Dover, R. B., Amponsah, E. K., Hou, T-H., Raza, H., & Kan, E. C. (2008). Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics. 於 2008 IEEE International SOI Conference Proceedings (頁 39-40). 文章 4656284 (Proceedings - IEEE International SOI Conference). https://doi.org/10.1109/SOI.2008.4656284

@inproceedings{e396e938bb1a4c1b91a3bab8fb0da5d0,

title = "Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics",

author = "Jaegoo Lee and Cha, {Judy J.} and Barron, {Sara C.} and Muller, {David A.} and {Van Dover}, {R. Bruce} and Amponsah, {Ebenezer K.} and Tuo-Hung Hou and Hassan Raza and Kan, {Edwin C.}",

year = "2008",

month = dec,

day = "24",

doi = "10.1109/SOI.2008.4656284",

language = "English",

isbn = "9781424419548",

series = "Proceedings - IEEE International SOI Conference",

pages = "39--40",

booktitle = "2008 IEEE International SOI Conference Proceedings",

note = "2008 IEEE International SOI Conference ; Conference date: 06-10-2008 Through 09-10-2008",

}

Lee, J, Cha, JJ, Barron, SC, Muller, DA, Van Dover, RB, Amponsah, EK, Hou, T-H, Raza, H & Kan, EC 2008, Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics. 於 2008 IEEE International SOI Conference Proceedings., 4656284, Proceedings - IEEE International SOI Conference, 頁 39-40, 2008 IEEE International SOI Conference, New Paltz, NY, United States, 6/10/08. https://doi.org/10.1109/SOI.2008.4656284

Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics. / Lee, Jaegoo; Cha, Judy J.; Barron, Sara C. 等.
2008 IEEE International SOI Conference Proceedings. 2008. p. 39-40 4656284 (Proceedings - IEEE International SOI Conference).

研究成果: Conference contribution › 同行評審

TY - GEN

T1 - Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics

AU - Lee, Jaegoo

AU - Cha, Judy J.

AU - Barron, Sara C.

AU - Muller, David A.

AU - Van Dover, R. Bruce

AU - Amponsah, Ebenezer K.

AU - Hou, Tuo-Hung

AU - Raza, Hassan

AU - Kan, Edwin C.

PY - 2008/12/24

Y1 - 2008/12/24

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U2 - 10.1109/SOI.2008.4656284

DO - 10.1109/SOI.2008.4656284

M3 - Conference contribution

AN - SCOPUS:57749184570

SN - 9781424419548

T3 - Proceedings - IEEE International SOI Conference

SP - 39

EP - 40

BT - 2008 IEEE International SOI Conference Proceedings

T2 - 2008 IEEE International SOI Conference

Y2 - 6 October 2008 through 9 October 2008

ER -

Lee J, Cha JJ, Barron SC, Muller DA, Van Dover RB, Amponsah EK 等. Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics. 於 2008 IEEE International SOI Conference Proceedings. 2008. p. 39-40. 4656284. (Proceedings - IEEE International SOI Conference). doi: 10.1109/SOI.2008.4656284