Making aging useful by recycling aging-induced clock skew

Tien Hung Tseng, Chung Han Chou, Kai Chiang Wu

研究成果: Article同行評審

摘要

Device aging, which causes significant loss on circuit performance and lifetime, has been a primary factor in reliability degradation of nanoscale designs. In this article, we propose to take advantage of aging-induced clock skews (i.e., make them useful for aging tolerance) by manipulating and recycling these time-varying skews to compensate for the performance degradation of logic networks. The goal is to assign achievable/reasonable aging-induced clock skews in a circuit, such that its effective performance degradation due to aging can be tolerated. On average, 21.21% aging tolerance can be achieved with insignificant design overhead. Moreover, we employVth assignment on clock buffers to further tolerate the aging-induced degradation of logic networks. WhenVth assignment is applied on top of aforementioned aging manipulation, the average aging tolerance can be enhanced to 29.15%.

原文English
文章編號13
期刊ACM Transactions on Design Automation of Electronic Systems
25
發行號2
DOIs
出版狀態Published - 12月 2019

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