Magneto-transport flipping induced by surface oxidation in Co films

T. Y. Chung, Shih-ying Hsu

研究成果: Article同行評審

4 引文 斯高帕斯(Scopus)

摘要

We have performed low temperature magnetoresistance (MR) and magnetization measurements for a series of thin Co films with different degrees of oxidation to investigate the role of surface oxidation on magnetic properties. For films with less oxidation, magneto-transport exhibits the typical anisotropic magnetoresistance behavior. However, magneto-transport flips completely in films with severe oxidation. The inverse MR is replaced by the normal MR when the applied magnetic field is along the current. The normal MR is changed to the inverse MR when the applied magnetic field is perpendicular to the current. Since the disorder will enhance the spin-orbital interaction and electron-electron interaction in thin films, we suggest that both mechanisms may be responsible for the flipping in anisotropic MR induced by surface oxidation.

原文English
文章編號042063
期刊Journal of Physics: Conference Series
150
發行號4
DOIs
出版狀態Published - 1 1月 2009

指紋

深入研究「Magneto-transport flipping induced by surface oxidation in Co films」主題。共同形成了獨特的指紋。

引用此