Machine Vision Observation, Artificial Intelligence Pattern Recognition, Protective Circuit Design, Characterization of Multiple Materials, and Nano-Structural Analysis for Investigating InGaN Green Light Emitting Diode Degradation in a Salty Water Vapor Environment

Cheng Shan Chen, Chun Yen Yang, Shao Jui Yang, Deng Yi Wang, Yaw Wen Kuo, Wei Han Hsiao, Hsin Hung Chou, Chia Feng Lin, Yung Hui Li, Yewchung Sermon Wu, Hsiang Chen*, Jung Han

*此作品的通信作者

研究成果: Conference contribution同行評審

摘要

This study delves into the degradation of GaN-based LEDs in saline environments, a relatively underexplored area of research. LEDs are known for their longevity, but face challenges under extreme conditions. Utilizing artificial intelligence, machine vision, and material analysis, this study detects early signs of LED degradation[1], [2]. The results highlight the impact of saline exposure on LED performance, with some LEDs continuing to function for up to 30 minutes before failure. Advanced circuits ensure uninterrupted operation. Encompassing electrical engineering, computer science, and materials science, this study provides a comprehensive approach to LED fault detection and protection.

原文English
主出版物標題2024 IEEE International Reliability Physics Symposium, IRPS 2024 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9798350369762
DOIs
出版狀態Published - 2024
事件2024 IEEE International Reliability Physics Symposium, IRPS 2024 - Grapevine, United States
持續時間: 14 4月 202418 4月 2024

出版系列

名字IEEE International Reliability Physics Symposium Proceedings
ISSN(列印)1541-7026

Conference

Conference2024 IEEE International Reliability Physics Symposium, IRPS 2024
國家/地區United States
城市Grapevine
期間14/04/2418/04/24

指紋

深入研究「Machine Vision Observation, Artificial Intelligence Pattern Recognition, Protective Circuit Design, Characterization of Multiple Materials, and Nano-Structural Analysis for Investigating InGaN Green Light Emitting Diode Degradation in a Salty Water Vapor Environment」主題。共同形成了獨特的指紋。

引用此