@inproceedings{ff49a8bdb5b14090b42542947c906194,
title = "Low-voltage-triggered PNP devices for ESD protection design in mixed-voltage I/O interface with over-VDD and under-VSS signal levels",
abstract = "ESD protection design for mixed-voltage I/O interfaces with the low-voltage-triggered PNP (LVTPNP) devices is proposed in this paper. The LVTPNP, by inserting N+ or P+ diffusion across the junction between N-well and P-substrate of the PNP devices, is designed to protect the mixed-voltage I/O pads for signals with voltage levels higher than VDD (over-VDD) and lower than VSS (under-VSS). The experimental results in a 0.35-μm CMOS process have proven that the ESD level of the proposed LVTPNP is higher than that of the traditional PNP device.",
author = "Ming-Dou Ker and Chang, {Wei Jen} and Lo, {Wen Yu}",
year = "2004",
month = jan,
day = "1",
doi = "10.1109/ISQED.2004.1283712",
language = "English",
isbn = "0769520936",
series = "Proceedings - 5th International Symposium on Quality Electronic Design, ISQUED 2004",
publisher = "IEEE Computer Society",
pages = "433--438",
booktitle = "Proceedings - 5th International Symposium on Quality Electronic Design, ISQUED 2004",
address = "United States",
note = "Proceedings - 5th International Symposium on Quality Electronic Design, ISQED 2004 ; Conference date: 22-03-2004 Through 24-03-2004",
}