Low-temperature direct copper-to-copper bonding enabled by creep on highly (1 1 1)-oriented Cu surfaces

Chien Min Liu, Han Wen Lin, Yi Cheng Chu, Chih Chen*, Dian Rong Lyu, Kuan-Neng Chen, King-Ning Tu

*此作品的通信作者

研究成果: Article同行評審

96 引文 斯高帕斯(Scopus)

摘要

We achieve low-temperature Cu-to-Cu direct bonding using highly (1 1 1)-orientated Cu films. The bonding temperature can be lowered to 200 C at a stress of 114 psi for 30 min at 10-3 torr. The temperature is lower than the reflow temperature of 250 C for Pb-free solders. Our breakthrough is based on the finding that the Cu (1 1 1) surface diffusivity is the fastest among all the planes of Cu and the bonding process can occur through surface diffusion creep on the (1 1 1) surfaces.

原文English
頁(從 - 到)65-68
頁數4
期刊Scripta Materialia
78-79
DOIs
出版狀態Published - 5月 2014

指紋

深入研究「Low-temperature direct copper-to-copper bonding enabled by creep on highly (1 1 1)-oriented Cu surfaces」主題。共同形成了獨特的指紋。

引用此