Low-leakage in0.53Ga0.47As p-i-n photodetector fabricated on GaAs substrate with linearly graded metamorphic in xGa1-xP buffer

Chi Kuan Lin*, Hao-Chung Kuo, Yu Sheng Liao, Gong Ru Lin

*此作品的通信作者

研究成果: Conference article同行評審

摘要

A novel top-illuminated metamorphic In0.53Ga0.47As p-i-n hotodiodes (MM-PINPD) grown on GaAs substrate by using a linearly graded InxGa1-xP (x graded from 0.51 to 1) buffer layer is reported. The dark current, optical responsivities, noise equivalent power (NEP), and operational bandwidth of the MM-PINPD with aperture diameter of 60 μm are 13 pA, 0.77/0.59 (1310/1550 nm) A/W, 6.9×10-11 W/Hz1/2, and 7.5 GHz, respectively. The performances of the MM-PINPD on GaAs are demonstrated to be better than those of a similar device made on InGaAs/InP substrate.

原文English
文章編號78
頁(從 - 到)399-406
頁數8
期刊Proceedings of SPIE - The International Society for Optical Engineering
5624
DOIs
出版狀態Published - 6 5月 2005
事件Semiconductor and Organic Optoelectronic Materials and Devices - Beijing, 中國
持續時間: 9 11月 200411 11月 2004

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