Low-leakage electrostatic discharge protection circuit in 65-nm fully-silicided CMOS technology

Keyphrases

• CMOS Technology 100%
• Electrostatic Discharge (ESD) Protection 100%
• Electrostatic Discharge 100%
• Protection Circuit 100%
• Fully Silicide 100%
• Low Leakage 100%
• Power Rail 66%
• Clamp Circuit 66%
• Standby Leakage Current 66%
• CMOS Process 33%
• Operating Conditions 33%
• Silicon Area 33%
• Room Temperature 33%
• Gate Current 33%
• Human Body Model 33%
• Detection Circuit 33%
• Electrostatic Discharge Test 33%
• Discharge State Detection 33%
• Machine Model 33%
• Low Leakage Power 33%

Engineering

• Electrostatic Discharge 100%
• Power Rail 50%
• Room Temperature 25%
• Human Body Model 25%
• Electrostatic Discharge Detection 25%