LOG filter based inspection of Cluster Mura and Vertical-Band Mura on Liquid Crystal Displays

In this paper, we propose the use of Laplacian of Gaussian (LOG) filters in the detection of Cluster Mura defects and Vertical-Band Mura defects on Liquid Crystal Displays. To detect Cluster Mura defects, 2-D LOG filters with their shapes matching the shapes of Cluster Mura are adopted. The optimal threshold for the detection of Cluster Mura is determined based on the SEMU formula. On the other hand, to detect Vertical-Band Mura, a 1-D LOG filter is used over the projected 1-D intensity profile to check if the variation tendency of the intensity profile is changed. The portions with inconsistently intensity variation are regarded as the portions where V-Band Muras occur. The simulation results demonstrate the LOG filters are very useful in the detection of Mura defects.