Lifting and sorting of charged Au nanoparticles by electrostatic forces in atomic force microscopy

Jia Peng Xu; Kwang Joo Kwak; James L. Lee; Gunjan Agarwal

doi:10.1002/smll.201000924

Lifting and sorting of charged Au nanoparticles by electrostatic forces in atomic force microscopy

Jia Peng Xu
, Kwang Joo Kwak
, James L. Lee
, Gunjan Agarwal^*

^*此作品的通信作者

生物藥學研究所

研究成果: Article › 同行評審

18 引文斯高帕斯（Scopus）

摘要

A new nanoparticle manipulation technique is demonstrated by application of electrostatic forces via the atomic force microscope (AFM) tip. Gold nanoparticles with a specific surface charge or mass could be selectively lifted up from a substrate by controlling the potential applied to the AFM tip.

原文	English
頁（從 - 到）	2105-2108
頁數	4
期刊	Small
卷	6
發行號	19
DOIs	https://doi.org/10.1002/smll.201000924
出版狀態	Published - 2010

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10.1002/smll.201000924

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title = "Lifting and sorting of charged Au nanoparticles by electrostatic forces in atomic force microscopy",

abstract = "A new nanoparticle manipulation technique is demonstrated by application of electrostatic forces via the atomic force microscope (AFM) tip. Gold nanoparticles with a specific surface charge or mass could be selectively lifted up from a substrate by controlling the potential applied to the AFM tip.",

author = "Xu, \{Jia Peng\} and Kwak, \{Kwang Joo\} and Lee, \{James L.\} and Gunjan Agarwal",

year = "2010",

doi = "10.1002/smll.201000924",

language = "English",

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T1 - Lifting and sorting of charged Au nanoparticles by electrostatic forces in atomic force microscopy

AU - Xu, Jia Peng

AU - Kwak, Kwang Joo

AU - Lee, James L.

AU - Agarwal, Gunjan

PY - 2010

Y1 - 2010

N2 - A new nanoparticle manipulation technique is demonstrated by application of electrostatic forces via the atomic force microscope (AFM) tip. Gold nanoparticles with a specific surface charge or mass could be selectively lifted up from a substrate by controlling the potential applied to the AFM tip.

AB - A new nanoparticle manipulation technique is demonstrated by application of electrostatic forces via the atomic force microscope (AFM) tip. Gold nanoparticles with a specific surface charge or mass could be selectively lifted up from a substrate by controlling the potential applied to the AFM tip.

UR - https://www.scopus.com/pages/publications/77957191627

U2 - 10.1002/smll.201000924

DO - 10.1002/smll.201000924

M3 - Article

C2 - 20818627

AN - SCOPUS:77957191627

SN - 1613-6810

VL - 6

SP - 2105

EP - 2108

JO - Small

JF - Small

IS - 19

ER -

Lifting and sorting of charged Au nanoparticles by electrostatic forces in atomic force microscopy

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