Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers

M. Schulz-Ruhtenberg; T. Ackemann; Kai-Feng Huang; I. Babushkin; N. Loiko

doi:10.1109/EQEC.2005.1567321

Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers

M. Schulz-Ruhtenberg^*, T. Ackemann, Kai-Feng Huang, I. Babushkin, N. Loiko

^*此作品的通信作者

電子物理學系

研究成果: Conference contribution › 同行評審

原文	English
主出版物標題	2005 European Quantum Electronics Conference, EQEC '05
頁面	150
頁數	1
DOIs	https://doi.org/10.1109/EQEC.2005.1567321
出版狀態	Published - 2005
事件	2005 European Quantum Electronics Conference, EQEC '05 - Munich, 德國持續時間: 12 6月 2005 → 17 6月 2005

出版系列

名字	2005 European Quantum Electronics Conference, EQEC '05
卷	2005

Conference

Conference	2005 European Quantum Electronics Conference, EQEC '05
國家/地區	德國
城市	Munich
期間	12/06/05 → 17/06/05

存取文件

10.1109/EQEC.2005.1567321

其它文件與鏈接

Link to publication in Scopus

引用此

Schulz-Ruhtenberg, M., Ackemann, T., Huang, K.-F., Babushkin, I., & Loiko, N. (2005). Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers. 於 2005 European Quantum Electronics Conference, EQEC '05 (頁 150). 文章 1567321 (2005 European Quantum Electronics Conference, EQEC '05; 卷 2005). https://doi.org/10.1109/EQEC.2005.1567321

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title = "Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers",

author = "M. Schulz-Ruhtenberg and T. Ackemann and Kai-Feng Huang and I. Babushkin and N. Loiko",

year = "2005",

doi = "10.1109/EQEC.2005.1567321",

language = "English",

isbn = "0780389735",

series = "2005 European Quantum Electronics Conference, EQEC '05",

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note = "2005 European Quantum Electronics Conference, EQEC '05 ; Conference date: 12-06-2005 Through 17-06-2005",

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Schulz-Ruhtenberg, M, Ackemann, T, Huang, K-F, Babushkin, I & Loiko, N 2005, Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers. 於 2005 European Quantum Electronics Conference, EQEC '05., 1567321, 2005 European Quantum Electronics Conference, EQEC '05, 卷 2005, 頁 150, 2005 European Quantum Electronics Conference, EQEC '05, Munich, 德國, 12/06/05. https://doi.org/10.1109/EQEC.2005.1567321

Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers. / Schulz-Ruhtenberg, M.; Ackemann, T.; Huang, Kai-Feng 等.
2005 European Quantum Electronics Conference, EQEC '05. 2005. p. 150 1567321 (2005 European Quantum Electronics Conference, EQEC '05; 卷 2005).

研究成果: Conference contribution › 同行評審

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AU - Schulz-Ruhtenberg, M.

AU - Ackemann, T.

AU - Huang, Kai-Feng

AU - Babushkin, I.

AU - Loiko, N.

PY - 2005

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M3 - Conference contribution

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SN - 0780389735

SN - 9780780389731

T3 - 2005 European Quantum Electronics Conference, EQEC '05

SP - 150

BT - 2005 European Quantum Electronics Conference, EQEC '05

T2 - 2005 European Quantum Electronics Conference, EQEC '05

Y2 - 12 June 2005 through 17 June 2005

ER -