Layout placement optimization with isolation rings for high-voltage VLSI circuits

Chih Wei Lee, Hwa Yi Tseng, Chi Lien Kuo, Chien-Nan Liu, Chin Hsia

研究成果: Conference contribution同行評審

4 引文 斯高帕斯(Scopus)

摘要

In the literature, there are many EDA works related to the layout placement of analog VLSI circuits. However, few of them are discussing about the placement of high-voltage VLSI circuits. Compared with typical circuits, the design of high-voltage circuits often requires isolation rings around transistors for better protection. Because isolation rings will occupy large chip area, it is necessary to develop proper EDA tools for the placement optimization with isolation rings to reduce the chip cost. In this paper, a placement optimization flow is proposed to consider both symmetry constraints and isolation rings for the layout automation of high-voltage circuits. Through changing the location of transistors inside every isolation rings, different shapes of isolation rings will be considered simultaneously during the placement algorithm to optimize the layout area. According to the experimental results, the proposed placement algorithm is able to reduce the chip area for high-voltage designs with isolation rings and still keeps the algorithm efficiency.

原文English
主出版物標題2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781509039692
DOIs
出版狀態Published - 5 6月 2017
事件2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017 - Hsinchu, 台灣
持續時間: 24 4月 201727 4月 2017

出版系列

名字2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017

Conference

Conference2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017
國家/地區台灣
城市Hsinchu
期間24/04/1727/04/17

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