Layout optimization on low-voltage-triggered PNP devices for ESD protection in mixed-voltage I/O interfaces

Wei Jen Chang; Ming-Dou Ker

doi:10.1109/IPFA.2004.1345599

Layout optimization on low-voltage-triggered PNP devices for ESD protection in mixed-voltage I/O interfaces

Wei Jen Chang^*, Ming-Dou Ker

^*此作品的通信作者

研究成果: Paper › 同行評審

4 引文斯高帕斯（Scopus）

摘要

Layout optimization on low-voltage-triggered PNP (LVTPNP) devices for ESD protection in mixed-voltage I/O interfaces is proposed in this paper. The experimental results in both 0.35-μm and 0.25-μm CMOS processes have proven that the ESD levels of the LVTPNP drawn in the multi-finger layout style are higher than that drawn in the original layout style. Moreover, the LVTPNP device in multi-finger layout style has been implemented in a 0.25-μm salicided CMOS process to protect successfully the input stage of an ADSL IC with power-rail ESD clamp circuit.

原文	English
頁面	213-216
頁數	4
DOIs	https://doi.org/10.1109/IPFA.2004.1345599
出版狀態	Published - 7月 2004
事件	Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2004 - , Taiwan 持續時間: 5 7月 2004 → 8 7月 2004

Conference

Conference	Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2004
國家/地區	Taiwan
期間	5/07/04 → 8/07/04

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10.1109/IPFA.2004.1345599

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title = "Layout optimization on low-voltage-triggered PNP devices for ESD protection in mixed-voltage I/O interfaces",

abstract = "Layout optimization on low-voltage-triggered PNP (LVTPNP) devices for ESD protection in mixed-voltage I/O interfaces is proposed in this paper. The experimental results in both 0.35-μm and 0.25-μm CMOS processes have proven that the ESD levels of the LVTPNP drawn in the multi-finger layout style are higher than that drawn in the original layout style. Moreover, the LVTPNP device in multi-finger layout style has been implemented in a 0.25-μm salicided CMOS process to protect successfully the input stage of an ADSL IC with power-rail ESD clamp circuit.",

author = "Chang, {Wei Jen} and Ming-Dou Ker",

year = "2004",

month = jul,

doi = "10.1109/IPFA.2004.1345599",

language = "English",

pages = "213--216",

note = "Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2004 ; Conference date: 05-07-2004 Through 08-07-2004",

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AU - Chang, Wei Jen

AU - Ker, Ming-Dou

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N2 - Layout optimization on low-voltage-triggered PNP (LVTPNP) devices for ESD protection in mixed-voltage I/O interfaces is proposed in this paper. The experimental results in both 0.35-μm and 0.25-μm CMOS processes have proven that the ESD levels of the LVTPNP drawn in the multi-finger layout style are higher than that drawn in the original layout style. Moreover, the LVTPNP device in multi-finger layout style has been implemented in a 0.25-μm salicided CMOS process to protect successfully the input stage of an ADSL IC with power-rail ESD clamp circuit.

AB - Layout optimization on low-voltage-triggered PNP (LVTPNP) devices for ESD protection in mixed-voltage I/O interfaces is proposed in this paper. The experimental results in both 0.35-μm and 0.25-μm CMOS processes have proven that the ESD levels of the LVTPNP drawn in the multi-finger layout style are higher than that drawn in the original layout style. Moreover, the LVTPNP device in multi-finger layout style has been implemented in a 0.25-μm salicided CMOS process to protect successfully the input stage of an ADSL IC with power-rail ESD clamp circuit.

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Y2 - 5 July 2004 through 8 July 2004

ER -

Layout optimization on low-voltage-triggered PNP devices for ESD protection in mixed-voltage I/O interfaces

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