Investigation on Polarization and Trapping Dominated Reliability for Ferroelectric-HfZrOxGe FinFET Inverters

Tzu Chieh Hong, Chun-Jung Su, Yao Jen Lee, Yi-Ming Li, Seiji Samukawa, Tien-Sheng Chao

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

指紋

深入研究「Investigation on Polarization and Trapping Dominated Reliability for Ferroelectric-HfZrOxGe FinFET Inverters」主題。共同形成了獨特的指紋。

Engineering & Materials Science

Chemical Compounds