Investigation on ESD Robustness of 1200-V D- Mode GaN MIS-HEMTs with HBM ESD Test and TLP Measurement

Chao Yang Ke, Wei Cheng Wang, Ming Dou Ker, Chih Yi Yang, Edward Yi Chang

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

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Keyphrases

Engineering

Physics