Investigation of the time dependent gate dielectric stability in SiC MOSFETs with planar and trench gate structures
- Wei Cheng Lin
- , Wei Chen Yu
- , Bang Ren Chen
- , Yu Sheng Hsiao
- , Zhen Hong Huang
- , Chia Lung Hung
- , Yi Kai Hsiao
- , Nai Jen Yeh
- , Hao Chung Kuo
- , Chang Ching Tu*
- , Tian Li Wu
*此作品的通信作者
研究成果: Article › 同行評審
9
引文
斯高帕斯（Scopus）