Investigation of Positive Bias Temperature Instability of 4H-SiC MOS Capacitors and Deep Interface States Extraction at 300°C

Yu Xin Wen*, Chia Hua Wang, Yi Kai Hsiao, Chia Lung Hung, Bing Yue Tsui

*此作品的通信作者

研究成果: Conference contribution同行評審

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Keyphrases

Physics

Engineering

Computer Science