Investigation of electrical pulse erasing method effect on current -voltage characteristics of organic bistable device

Po-Tsung Lee*, Tzu Yueh Chang, Szu Yuan Chen

*此作品的通信作者

研究成果: Conference contribution同行評審

摘要

The electrical characteristics of the organic bistable devices with Al/Alq3/n-type Si structure with an electrical pulse erasing method are investigated. The bistable characteristic similar to that of metal/organic semiconductor/metal structure is demonstrated as well. Furthermore, generation of extra defects at both interfaces introduces variations on the electrical behaviors when erasing voltage conditions are applied on the organic bistable device. This device shows extremely easy fabrication processes and great potential in future advanced organic display.

原文English
主出版物標題IDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings
頁面865-868
頁數4
出版狀態Published - 2007
事件International Display Manufacturing Conference and Exhibition, IDMC 2007 - Taipei, 台灣
持續時間: 3 7月 20076 7月 2007

出版系列

名字IDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings

Conference

ConferenceInternational Display Manufacturing Conference and Exhibition, IDMC 2007
國家/地區台灣
城市Taipei
期間3/07/076/07/07

指紋

深入研究「Investigation of electrical pulse erasing method effect on current -voltage characteristics of organic bistable device」主題。共同形成了獨特的指紋。

引用此