Investigation of deposition technique and thickness effect of HfO2 film in bilayer InWZnO-based conductive bridge random access memory

Chih Chieh Hsu, Po Tsun Liu*, Kai Jhih Gan, Dun Bao Ruan, Simon M. Sze

*此作品的通信作者

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2 引文 斯高帕斯(Scopus)

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Chemical Compounds

Engineering & Materials Science

Physics & Astronomy