Investigation of degradation of single-cell PV module by pressure cooker test and damp heat test

Chao Ming Tung, Yu Tai Li, Wei Lun Yang, Hung Sen Wu, Peichen Yu

研究成果: Conference contribution同行評審

5 引文 斯高帕斯(Scopus)

摘要

Accelerated methods for evaluating thermo humidity resistance of single-cell PV module are demonstrated with standard damp heat test (DH) and non-standard pressure cooker test (PCT). We investigated the failure mechanism of PCT. Our result shows testing under PCT more than 121 °C has fast degradation compared to other condition.

原文English
主出版物標題2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
發行者Institute of Electrical and Electronics Engineers Inc.
頁面935-937
頁數3
ISBN(電子)9781509027248
DOIs
出版狀態Published - 18 11月 2016
事件43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, 美國
持續時間: 5 6月 201610 6月 2016

出版系列

名字Conference Record of the IEEE Photovoltaic Specialists Conference
2016-November
ISSN(列印)0160-8371

Conference

Conference43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
國家/地區美國
城市Portland
期間5/06/1610/06/16

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