Investigation of Cu 0.5Ni 0.5/Nb interface transparency by using current-perpendicular-to-plane measurement

S. Y. Huang, J. J. Liang, Shih-Ying Hsu, L. K. Lin, T. C. Tsai, S. F. Lee

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2 引文 斯高帕斯（Scopus）

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Keyphrases

Engineering

Mathematics

Physics

Material Science