Investigation of backgate-bias dependence of threshold-voltage sensitivity to process and temperature variations for ultra-thin-body hetero-channel MOSFETs

Chang Hung Yu, Pin Su

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    深入研究「Investigation of backgate-bias dependence of threshold-voltage sensitivity to process and temperature variations for ultra-thin-body hetero-channel MOSFETs」主題。共同形成了獨特的指紋。

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    Engineering

    Physics