Investigation of AlGaN/GaN HEMT Breakdown analysis with Source field plate length for High power applications

D. Godfrey, D. Nirmal, L. Arivazhagan, Yu Lin Chen, Tien Han Yu, Brigis Roy, Wen Kuan Yeh, D. Godwinraj

研究成果: Conference contribution › 同行評審

13 引文 斯高帕斯（Scopus）

指紋

深入研究「Investigation of AlGaN/GaN HEMT Breakdown analysis with Source field plate length for High power applications」主題。共同形成了獨特的指紋。

Keyphrases

Engineering