TY - JOUR
T1 - Intrinsic Difference between 2-D Negative-Capacitance FETs with Semiconductor-on-Insulator and Double-Gate Structures
AU - You, Wei Xiang
AU - Su, Pin
PY - 2018/10/1
Y1 - 2018/10/1
N2 - With the aid of an analytical and general model, this paper investigates the intrinsic difference in the negative-capacitance (NC) effect and design space between semiconductor-on-insulator (SOI) and double-gate (DG) metal-ferroelectric-insulator-semiconductor-type NC field-effect transistors (NCFETs) with a 2-D semiconducting transition-metal-dichalcogenide channel (2-D NCFET). By examining the distributions of internal charge, voltage gain, and capacitance matching over the whole bias range, the intrinsic difference in NC effects between these two topologies is pointed out and explained. Our study indicates that for an intrinsic DG 2-D NCFET, it is difficult to achieve sub-2.3 kT/q average subthreshold swing (SS). By contrast, the bias-dependent subthreshold internal charge and larger curvature of ferroelectric capacitance due to the independent backgate in the SOI 2-D NCFET enable larger design space and sub-2.3 kT/q average SS, making it more suitable for low-power applications.
AB - With the aid of an analytical and general model, this paper investigates the intrinsic difference in the negative-capacitance (NC) effect and design space between semiconductor-on-insulator (SOI) and double-gate (DG) metal-ferroelectric-insulator-semiconductor-type NC field-effect transistors (NCFETs) with a 2-D semiconducting transition-metal-dichalcogenide channel (2-D NCFET). By examining the distributions of internal charge, voltage gain, and capacitance matching over the whole bias range, the intrinsic difference in NC effects between these two topologies is pointed out and explained. Our study indicates that for an intrinsic DG 2-D NCFET, it is difficult to achieve sub-2.3 kT/q average subthreshold swing (SS). By contrast, the bias-dependent subthreshold internal charge and larger curvature of ferroelectric capacitance due to the independent backgate in the SOI 2-D NCFET enable larger design space and sub-2.3 kT/q average SS, making it more suitable for low-power applications.
KW - 2-D semiconductors
KW - Landau-Khalatnikov (L-K) equation
KW - double-gate (DG)
KW - ferroelectric field-effect transistor (FET)
KW - metal-ferroelectric-insulator-semiconductor (MFIS)-type negative-capacitance (NC) FET (NCFET)
KW - semiconductor-on-insulator (SOI)
KW - transition-metal-dichalcogenide (TMD)
UR - http://www.scopus.com/inward/record.url?scp=85052803429&partnerID=8YFLogxK
U2 - 10.1109/TED.2018.2866125
DO - 10.1109/TED.2018.2866125
M3 - Article
AN - SCOPUS:85052803429
SN - 0018-9383
VL - 65
SP - 4196
EP - 4201
JO - IEEE Transactions on Electron Devices
JF - IEEE Transactions on Electron Devices
IS - 10
M1 - 8454292
ER -