Interchangeable Hebbian and Anti-Hebbian STDP Applied to Supervised Learning in Spiking Neural Network

Che Chia Chang; Pin Chun Chen; Boris Hudec; Po-Tsun Liu; Tuo-Hung Hou

doi:10.1109/IEDM.2018.8614648

Interchangeable Hebbian and Anti-Hebbian STDP Applied to Supervised Learning in Spiking Neural Network

Che Chia Chang, Pin Chun Chen, Boris Hudec, Po-Tsun Liu, Tuo-Hung Hou

研究成果: Conference contribution › 同行評審

4 引文斯高帕斯（Scopus）

摘要

This work provides a complete framework, including device, architecture, and algorithm, for implementing bio-inspired supervised spiking neural networks (SNNs) on hardware. An analog synapse with atypical dual bipolar resistive-switching (D-BRS) modes demonstrates interchangeable Hebbian spiking-timing-dependent plasticity (STDP) and anti-Hebbian STDP, and it is capable of implementing supervised ReSuMe SNNs in crossbar arrays. By using an 'exchange' update scheme, accurate supervised learning (∼96% for MNIST) is achieved in a compact network.

原文	English
主出版物標題	2018 IEEE International Electron Devices Meeting, IEDM 2018
發行者	Institute of Electrical and Electronics Engineers Inc.
頁面	15.5.1-15.5.4
ISBN（電子）	9781728119878
DOIs	https://doi.org/10.1109/IEDM.2018.8614648
出版狀態	Published - 16 1月 2019
事件	64th Annual IEEE International Electron Devices Meeting, IEDM 2018 - San Francisco, United States 持續時間: 1 12月 2018 → 5 12月 2018

出版系列

名字	Technical Digest - International Electron Devices Meeting, IEDM
卷	2018-December
ISSN（列印）	0163-1918

Conference

Conference	64th Annual IEEE International Electron Devices Meeting, IEDM 2018
國家/地區	United States
城市	San Francisco
期間	1/12/18 → 5/12/18

存取文件

10.1109/IEDM.2018.8614648

其它文件與鏈接

Link to publication in Scopus

引用此

Chang, C. C., Chen, P. C., Hudec, B., Liu, P-T., & Hou, T-H. (2019). Interchangeable Hebbian and Anti-Hebbian STDP Applied to Supervised Learning in Spiking Neural Network. 於 2018 IEEE International Electron Devices Meeting, IEDM 2018 (頁 15.5.1-15.5.4). [8614648] (Technical Digest - International Electron Devices Meeting, IEDM; 卷 2018-December). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IEDM.2018.8614648

@inproceedings{d887ad16d3cb4335bf91c2f8996b4734,

title = "Interchangeable Hebbian and Anti-Hebbian STDP Applied to Supervised Learning in Spiking Neural Network",

abstract = "This work provides a complete framework, including device, architecture, and algorithm, for implementing bio-inspired supervised spiking neural networks (SNNs) on hardware. An analog synapse with atypical dual bipolar resistive-switching (D-BRS) modes demonstrates interchangeable Hebbian spiking-timing-dependent plasticity (STDP) and anti-Hebbian STDP, and it is capable of implementing supervised ReSuMe SNNs in crossbar arrays. By using an 'exchange' update scheme, accurate supervised learning (∼96% for MNIST) is achieved in a compact network.",

author = "Chang, {Che Chia} and Chen, {Pin Chun} and Boris Hudec and Po-Tsun Liu and Tuo-Hung Hou",

year = "2019",

month = jan,

day = "16",

doi = "10.1109/IEDM.2018.8614648",

language = "English",

series = "Technical Digest - International Electron Devices Meeting, IEDM",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "15.5.1--15.5.4",

booktitle = "2018 IEEE International Electron Devices Meeting, IEDM 2018",

address = "United States",

note = "null ; Conference date: 01-12-2018 Through 05-12-2018",

}

Chang, CC, Chen, PC, Hudec, B, Liu, P-T & Hou, T-H 2019, Interchangeable Hebbian and Anti-Hebbian STDP Applied to Supervised Learning in Spiking Neural Network. 於 2018 IEEE International Electron Devices Meeting, IEDM 2018., 8614648, Technical Digest - International Electron Devices Meeting, IEDM, 卷 2018-December, Institute of Electrical and Electronics Engineers Inc., 頁 15.5.1-15.5.4, 64th Annual IEEE International Electron Devices Meeting, IEDM 2018, San Francisco, United States, 1/12/18. https://doi.org/10.1109/IEDM.2018.8614648

Interchangeable Hebbian and Anti-Hebbian STDP Applied to Supervised Learning in Spiking Neural Network. / Chang, Che Chia; Chen, Pin Chun; Hudec, Boris 等.

2018 IEEE International Electron Devices Meeting, IEDM 2018. Institute of Electrical and Electronics Engineers Inc., 2019. p. 15.5.1-15.5.4 8614648 (Technical Digest - International Electron Devices Meeting, IEDM; 卷 2018-December).

研究成果: Conference contribution › 同行評審

TY - GEN

T1 - Interchangeable Hebbian and Anti-Hebbian STDP Applied to Supervised Learning in Spiking Neural Network

AU - Chang, Che Chia

AU - Chen, Pin Chun

AU - Hudec, Boris

AU - Liu, Po-Tsun

AU - Hou, Tuo-Hung

PY - 2019/1/16

Y1 - 2019/1/16

N2 - This work provides a complete framework, including device, architecture, and algorithm, for implementing bio-inspired supervised spiking neural networks (SNNs) on hardware. An analog synapse with atypical dual bipolar resistive-switching (D-BRS) modes demonstrates interchangeable Hebbian spiking-timing-dependent plasticity (STDP) and anti-Hebbian STDP, and it is capable of implementing supervised ReSuMe SNNs in crossbar arrays. By using an 'exchange' update scheme, accurate supervised learning (∼96% for MNIST) is achieved in a compact network.

AB - This work provides a complete framework, including device, architecture, and algorithm, for implementing bio-inspired supervised spiking neural networks (SNNs) on hardware. An analog synapse with atypical dual bipolar resistive-switching (D-BRS) modes demonstrates interchangeable Hebbian spiking-timing-dependent plasticity (STDP) and anti-Hebbian STDP, and it is capable of implementing supervised ReSuMe SNNs in crossbar arrays. By using an 'exchange' update scheme, accurate supervised learning (∼96% for MNIST) is achieved in a compact network.

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U2 - 10.1109/IEDM.2018.8614648

DO - 10.1109/IEDM.2018.8614648

M3 - Conference contribution

AN - SCOPUS:85061785057

T3 - Technical Digest - International Electron Devices Meeting, IEDM

SP - 15.5.1-15.5.4

BT - 2018 IEEE International Electron Devices Meeting, IEDM 2018

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 1 December 2018 through 5 December 2018

ER -

Chang CC, Chen PC, Hudec B, Liu P-T , Hou T-H. Interchangeable Hebbian and Anti-Hebbian STDP Applied to Supervised Learning in Spiking Neural Network. 於 2018 IEEE International Electron Devices Meeting, IEDM 2018. Institute of Electrical and Electronics Engineers Inc. 2019. p. 15.5.1-15.5.4. 8614648. (Technical Digest - International Electron Devices Meeting, IEDM). doi: 10.1109/IEDM.2018.8614648

Interchangeable Hebbian and Anti-Hebbian STDP Applied to Supervised Learning in Spiking Neural Network

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Conference

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指紋

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