Initial-on BSD protection design with PMO S-triggered SCR device

Ming Dou Ker*, Shih Hung Chen

*此作品的通信作者

    研究成果: Conference contribution同行評審

    3 引文 斯高帕斯(Scopus)

    摘要

    A novel SCR design with "initial-on" function is proposed to achieve the lowest trigger voltage and the fastest turn-on speed of SCR device for effective on-chip ESD protection. Without using the special native device or any process modification, this initial-on design is implemented by PMOS-triggered SCR device, which can be realized in general CMOS processes. This initial-on SCR design also presents a high enough holding voltage to avoid latchup issue. The new proposed initial-on ESD protection design with PMOS-triggered SCR device has been successfully verified in a 0.25-μm CMOS process.

    原文English
    主出版物標題2005 IEEE Asian Solid-State Circuits Conference, ASSCC 2005
    發行者IEEE Computer Society
    頁面105-108
    頁數4
    ISBN(列印)0780391624, 9780780391628
    DOIs
    出版狀態Published - 1 1月 2005
    事件1st IEEE Asian Solid-State Circuits Conference, ASSCC 2005 - Hsinchu, Taiwan
    持續時間: 1 11月 20053 11月 2005

    出版系列

    名字2005 IEEE Asian Solid-State Circuits Conference, ASSCC 2005

    Conference

    Conference1st IEEE Asian Solid-State Circuits Conference, ASSCC 2005
    國家/地區Taiwan
    城市Hsinchu
    期間1/11/053/11/05

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