Influence of Fringing-Field on DC/AC Characteristics of Si1-xGex Based Multi-Channel Tunnel FETs

Narasimhulu Thoti, Yi-Ming Li*

*此作品的通信作者

研究成果: Article同行評審

16 引文 斯高帕斯(Scopus)

指紋

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Keyphrases

Engineering

Material Science