In-situ studies of the crystallization of amorphous CoSi2 films

David A. Smith*, King-Ning Tu, B. Z. Weiss

*此作品的通信作者

研究成果: Article同行評審

8 引文 斯高帕斯(Scopus)

摘要

The crystallization of amorphous CoSi2 is an ideal phase transformation for in-situ studies. This system satisfies the assumptions underlying the Johnson-Mehl-Avrami analysis rather well and produces a microstructure which can be modelled realistically. The nucleation rate can be measured independently of the growth rate. The activation energy for growth is found to be 1.1 eV/atom and microstructural observations suggest that the interface between amorphous and crystalline material is likely to advance by a ledge mechanism.

原文English
頁(從 - 到)90-96
頁數7
期刊Ultramicroscopy
30
發行號1-2
DOIs
出版狀態Published - 1 1月 1989

指紋

深入研究「In-situ studies of the crystallization of amorphous CoSi2 films」主題。共同形成了獨特的指紋。

引用此