摘要
The crystallization of amorphous CoSi2 is an ideal phase transformation for in-situ studies. This system satisfies the assumptions underlying the Johnson-Mehl-Avrami analysis rather well and produces a microstructure which can be modelled realistically. The nucleation rate can be measured independently of the growth rate. The activation energy for growth is found to be 1.1 eV/atom and microstructural observations suggest that the interface between amorphous and crystalline material is likely to advance by a ledge mechanism.
原文 | English |
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頁(從 - 到) | 90-96 |
頁數 | 7 |
期刊 | Ultramicroscopy |
卷 | 30 |
發行號 | 1-2 |
DOIs | |
出版狀態 | Published - 1 1月 1989 |