Improving Safe-Operating-Area of a 5-V n-Channel Large Array MOSFET in a 0.15-μ m BCD Process

Karuna Nidhi, Ming-Dou Ker*, Tingyou Lin, Jian Hsing Lee

*此作品的通信作者

研究成果: Article同行評審

6 引文 斯高帕斯(Scopus)

指紋

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Keyphrases

Engineering