摘要
In this letter, the effect of CF4 plasma treatment on poly(3-hexylthiophene)-based organic thin-film transistors has been investigated. It was found that CF4 plasma treatment on the source/drain electrode can reduce contact resistance and increase mobility. The CF4 plasma treatment can increase the mobility from 0.0021 to 0.0102 cm2Vs and decrease the contact resistance by about 70%. Moreover, the CF4 plasma treatment is compatible with the bottom-gate bottom-contact structure without degrading the SiO2 layer.
原文 | English |
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文章編號 | 6471742 |
頁(從 - 到) | 538-540 |
頁數 | 3 |
期刊 | IEEE Electron Device Letters |
卷 | 34 |
發行號 | 4 |
DOIs | |
出版狀態 | Published - 11 3月 2013 |