Improvement of low dielectric constant methylsilsesquioxane by boron implantation treatment

T. C. Chang, Y. S. Mor, Po-Tsun Liu, T. M. Tsai, C. W. Chen, S. M. Sze, Y. J. Mei

研究成果: Article同行評審

9 引文 斯高帕斯(Scopus)

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Keyphrases

Material Science