摘要
We present in this paper the MOCVD growth and characterization of high performance 850nm InGaAsP/InGaP strain-compensated MQWs vertical-cavity surface-emitting lasers (VCSELs). These VCSELs exhibit superior characteristics, with threshold currents ∼0.4 mA, and slope efficiencies ∼ 0.6 mW/mA. The threshold current change is less than 0.2 mA and the slope efficiency drops by less than ∼30% when the substrate temperature is raised from room temperature to 85°C. These VCSELs also demonstrate high speed modulation bandwidth up to 12.5Gbit/s from 25°C to 85°C.
原文 | English |
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頁(從 - 到) | 221-226 |
頁數 | 6 |
期刊 | Proceedings of SPIE - The International Society for Optical Engineering |
卷 | 5364 |
DOIs | |
出版狀態 | Published - 2004 |
事件 | Vertical-Cavity Surface-Emitting lasers VIII - San Jose, CA, 美國 持續時間: 28 1月 2004 → 29 1月 2004 |