Improved retention characteristic in polycrystalline silicon-oxide-hafnium oxide-oxide-silicon-type nonvolatile memory with robust tunnel oxynitride

Chih Ren Hsieh, Chiung Hui Lai, Bo Chun Lin, Yuan Kai Zheng, Jen Chung Lou, Kuo-Jui Lin

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    2 引文 斯高帕斯（Scopus）

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    深入研究「Improved retention characteristic in polycrystalline silicon-oxide-hafnium oxide-oxide-silicon-type nonvolatile memory with robust tunnel oxynitride」主題。共同形成了獨特的指紋。

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    Material Science