Improved luminance intensity of InGaN-GaN light-emitting diode by roughening both p-GaN and undoped-GaN surfaces and applying a mirror to the sapphire substrate surface

Cheng Liao*, Wei Chih Peng, Yew-Chuhg Wu

*此作品的通信作者

研究成果: Conference contribution同行評審

摘要

InGaN-GaN light emitting diodes (LEDs) with double roughened surfaces and silver mirror was fabricated by surface-roughening, wafer-bonding and laser lift-off technologies. It was found the light intensity of DRM-LED (with mirror between undoped-GaN/sapphire interface) was 3.05 times higher than that of the PR-LED (with only roughened p-GaN surface), and 1.45 times higher than that of the DRSM-LED (with mirror on the backside of sapphire substrate).

原文English
主出版物標題ECS Transactions - 46th State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XLVI) and the 2nd International Symposium on Processes at the Semiconductor-Solution Interface
頁面201-203
頁數3
版本2
DOIs
出版狀態Published - 1 12月 2007
事件46th State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XLVI) and the 2nd International Symposium on Processes at the Semiconductor-Solution Interface - 211th ECS Meeting - Chicago, IL, United States
持續時間: 6 5月 200710 5月 2007

出版系列

名字ECS Transactions
號碼2
6
ISSN(列印)1938-5862
ISSN(電子)1938-6737

Conference

Conference46th State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XLVI) and the 2nd International Symposium on Processes at the Semiconductor-Solution Interface - 211th ECS Meeting
國家/地區United States
城市Chicago, IL
期間6/05/0710/05/07

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