Improved electrical performance of NILC poly-Si TFTs manufactured using H2SO4 and HCl solution

Yu Chung Chen*, Yu Cheng Chao, Yew-Chuhg Wu

*此作品的通信作者

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

摘要

In this study, we fabricated a NILC surface on a SiO2-coated silicon wafer, and then used HCl solution and H2SO4 + H2O2 solution to do surface treatment. The treatment could reduce Ni or NiSi2 that was trapped at the surface of silicon and therefore the electrical characteristics of these devices were improved.

原文English
主出版物標題Thin Film Transistors 10, TFT 10
頁面165-168
頁數4
版本5
DOIs
出版狀態Published - 1 12月 2010
事件10th Symposium on Thin Film Transistor Technologies, TFT 10 - 218th ECS Meeting - Las Vegas, NV, United States
持續時間: 11 10月 201015 10月 2010

出版系列

名字ECS Transactions
號碼5
33
ISSN(列印)1938-5862
ISSN(電子)1938-6737

Conference

Conference10th Symposium on Thin Film Transistor Technologies, TFT 10 - 218th ECS Meeting
國家/地區United States
城市Las Vegas, NV
期間11/10/1015/10/10

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