Impacts of work function variation and line-edge roughness on TFET and FinFET devices and 32-bit CLA circuits

Yin Nien Chen*, Chien Ju Chen, Ming Long Fan, Vita Pi Ho Hu, Pin Su, Ching Te Chuang

*此作品的通信作者

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    9 引文 斯高帕斯(Scopus)

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    Engineering