Impacts of work function variation and line edge roughness on hybrid TFET-MOSFET monolithic 3D SRAMs

Jian Hao Wang, Pin Su, Ching Te Chuang

    研究成果: Conference contribution › 同行評審

    1 引文 斯高帕斯（Scopus）

    指紋

    深入研究「Impacts of work function variation and line edge roughness on hybrid TFET-MOSFET monolithic 3D SRAMs」主題。共同形成了獨特的指紋。

    Keyphrases

    Engineering