Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal-Ferroelectric-Insulator-Semiconductor Capacitors

Cheng Hung Wu, Nicolo' Ronchi, Kuan Chi Wang, Yu Yun Wang, Sean McMitchell, Kaustuv Banerjee, Geert Van Den Bosch, Jan Van Houdt, Tian Li Wu*

*此作品的通信作者

研究成果: Article同行評審

2 引文 斯高帕斯(Scopus)

摘要

In this work, the impacts of various pulsing schemes on endurance are comprehensively investigated. Trapezoidal and triangular waveforms are considered in endurance cycling tests. For endurance cycling with the trapezoidal waveforms, different rising time (Tr)/falling time (Tf), e.g., 0.05-5 μ s, with a fixed pulse width (Twidth) and different pulse width (Twidth), i.e., 0-10 μ s, with fixed rising time (Tr)/falling time (Tf) are used. As for the endurance cycling with the triangular waveforms, the frequencies are ranged from 1 kHz to 1 MHz. The results indicate that a shorter rising time (Tr)/falling time (Tf) results in a completely different endurance characteristic, and a longer Twidth leads to an earlier breakdown. Furthermore, the higher frequency of the triangular waveform results in a larger remnant polarization (2Pr) after endurance cycling. Overall, the endurance is highly dependent on the pulsing schemes, suggesting that a standardized methodology for the endurance evaluation is necessary for fair benchmarks and qualification of the ferroelectric-based technologies.

原文English
頁(從 - 到)109-114
頁數6
期刊IEEE Journal of the Electron Devices Society
10
DOIs
出版狀態Published - 2022

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