Impact of gate-induced drain leakage current on the tail distribution of DRAM data retention time

K. Saino, S. Horiba, S. Uchiyama, Y. Takaishi, M. Takenaka, T. Uchida, Y. Takada, K. Koyama, H. Miyake, Chen-Ming Hu

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    Engineering & Materials Science

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    Physics & Astronomy