Impact of gate dielectrics and oxygen annealing on tin-oxide thin-film transistors

Chia Wen Zhong, Horng-Chih Lin, Jung Ruey Tsai, Kou Chen Liu, Tiao Yuan Huang

研究成果: Article同行評審

11 引文 斯高帕斯(Scopus)

指紋

深入研究「Impact of gate dielectrics and oxygen annealing on tin-oxide thin-film transistors」主題。共同形成了獨特的指紋。

Keyphrases

Material Science