Impact of annealing environment on performance of InWZnO conductive bridge random access memory

Keyphrases

• Annealing 40%
• Annealing Atmosphere 20%
• Annealing Environment 100%
• Annealing Process 20%
• As-deposited 20%
• Circuit Application 20%
• Conductive Bridging Random Access Memory (CBRAM) 100%
• Display Circuit 20%
• Electrical Properties 20%
• Endurance Cycle 20%
• Indium Zinc Oxide 20%
• Integrated Display 20%
• InZnO 20%
• Long Retention Time 20%
• Memory Device 40%
• Nitrogen Annealing 20%
• Nitrogen Atmosphere 20%
• Oxygen Vacancy 20%
• Resistive State 20%
• Switching Material 20%
• Tungsten Doping 20%
• W-doped 20%
• X-ray Photoelectron Spectroscopy Analysis 20%

Engineering

• Annealing Process 20%
• Conductive 100%
• Oxygen Vacancy 20%
• Random Access Memory 100%
• Random Access Memory Device 40%
• Ray Photoelectron Spectroscopy 20%
• Retention Time 20%

Material Science

• Annealing 100%
• Electronic Circuit 25%
• Indium 25%
• Novel Material 25%
• Oxygen Vacancy 25%
• Tungsten 25%
• X-Ray Photoelectron Spectroscopy 25%
• Zinc Oxide 25%