摘要
The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance.
| 原文 | English |
|---|---|
| 文章編號 | 4815988 |
| 頁(從 - 到) | 2221-2223 |
| 頁數 | 3 |
| 期刊 | IEEE Transactions on Magnetics |
| 卷 | 45 |
| 發行號 | 5 |
| DOIs | |
| 出版狀態 | Published - 5月 2009 |