摘要
The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance.
原文 | English |
---|---|
文章編號 | 4815988 |
頁(從 - 到) | 2221-2223 |
頁數 | 3 |
期刊 | IEEE Transactions on Magnetics |
卷 | 45 |
發行號 | 5 |
DOIs | |
出版狀態 | Published - 5月 2009 |