TY - JOUR
T1 - Image Data Assessment Approach for Deep Learning-Based Metal Surface Defect-Detection Systems
AU - Lin, Hsien I.
AU - Wibowo, Fauzy Satrio
N1 - Publisher Copyright:
© 2013 IEEE.
PY - 2021
Y1 - 2021
N2 - The current trend in automated optical inspection (AOI) systems employs deep learning models to detect defects on a metal surface. The setback of deep learning models is that they are time-consuming because the images obtained after every lighting adjustment must be used to train the deep learning models again and confirm whether the detection results have improved. To save the time spent using datasets to train deep networks, we proposed a comprehensive assessment score that combines defect visibility, visibility distribution, and overexposure based on the operation principles of convolution neural networks. It can be used to assess whether the training image dataset can improve the defect detection rate of the deep learning model such as You Only Look Once (YOLO), Single Shot MultiBox Detector (SSD), and Faster Region-based Convolutional Neural Network (Faster R-CNN) without training defect image datasets. We collected all of the weight combinations with the right prediction results and used linear regression to obtain the optimal weight coefficients. We found that visibility and overexposure had a greater impact on the comprehensive assessment score. We compared the proposed approach with existing image quality assessment methods, including mean absolute error (MAE), peak signal-to-noise ratio (PSNR), universal image quality index (UIQI), natural image quality evaluator (NIQE), perception-based quality evaluator (PIQE), and blind/referenceless image spatial quality evaluator (BRISQUE). The experiment results indicated that our proposed comprehensive assessment score is more correlated to the F2-score of the detection models than the IQA methods by the verification methods of Spearman Rank Correlation Coefficient (SRCC), Pearson Correlation, and Kendall Correlation. Thus, referring to this index during the collection of image data and choosing datasets with the highest score to train the model will produce better detection accuracy.
AB - The current trend in automated optical inspection (AOI) systems employs deep learning models to detect defects on a metal surface. The setback of deep learning models is that they are time-consuming because the images obtained after every lighting adjustment must be used to train the deep learning models again and confirm whether the detection results have improved. To save the time spent using datasets to train deep networks, we proposed a comprehensive assessment score that combines defect visibility, visibility distribution, and overexposure based on the operation principles of convolution neural networks. It can be used to assess whether the training image dataset can improve the defect detection rate of the deep learning model such as You Only Look Once (YOLO), Single Shot MultiBox Detector (SSD), and Faster Region-based Convolutional Neural Network (Faster R-CNN) without training defect image datasets. We collected all of the weight combinations with the right prediction results and used linear regression to obtain the optimal weight coefficients. We found that visibility and overexposure had a greater impact on the comprehensive assessment score. We compared the proposed approach with existing image quality assessment methods, including mean absolute error (MAE), peak signal-to-noise ratio (PSNR), universal image quality index (UIQI), natural image quality evaluator (NIQE), perception-based quality evaluator (PIQE), and blind/referenceless image spatial quality evaluator (BRISQUE). The experiment results indicated that our proposed comprehensive assessment score is more correlated to the F2-score of the detection models than the IQA methods by the verification methods of Spearman Rank Correlation Coefficient (SRCC), Pearson Correlation, and Kendall Correlation. Thus, referring to this index during the collection of image data and choosing datasets with the highest score to train the model will produce better detection accuracy.
KW - Deep learning model
KW - comprehensive assessment score
KW - defect detection
KW - image quality assessment
KW - metal surface
UR - http://www.scopus.com/inward/record.url?scp=85103255969&partnerID=8YFLogxK
U2 - 10.1109/ACCESS.2021.3068256
DO - 10.1109/ACCESS.2021.3068256
M3 - Article
AN - SCOPUS:85103255969
SN - 2169-3536
VL - 9
SP - 47621
EP - 47638
JO - IEEE Access
JF - IEEE Access
M1 - 9383285
ER -