IIB-2 Direct Tunneling in Thin Gate-Oxide MOS Structure

Chi Chang, Robert W. Brodersen, Mong Song Liang, Chen-Ming Hu

研究成果: Article › 同行評審

原文	English
頁（從 - 到）	1571-1572
頁數	2
期刊	IEEE Transactions on Electron Devices
卷	30
發行號	11
DOIs	https://doi.org/10.1109/T-ED.1983.21350
出版狀態	Published - 1 1月 1983

存取文件

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author = "Chi Chang and Brodersen, {Robert W.} and Liang, {Mong Song} and Chen-Ming Hu",

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AU - Brodersen, Robert W.

AU - Liang, Mong Song

AU - Hu, Chen-Ming

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