Identification of fault types for single faults in bitonic sorters

Tsern-Huei Lee*, Jin Jye Chou

*此作品的通信作者

研究成果: Paper同行評審

摘要

In a previous paper, we presented a procedure for detecting and locating single solid logical faults in bitonic sorters. We showed that it takes at most four tests to detect a single fault and most faults need only two tests to be detected. In this paper we present a procedure for identifying the fault type, assuming the faulty component has been located. In general, in order to identify the fault type, one needs to know whether the faulty sorting element is an up sorting element or a down sorting element as well as the values of erroneous and unidentified outputs. For some sorting element faults, an additional test is required to identify the fault types.

原文English
頁面516-522
頁數7
DOIs
出版狀態Published - 18 6月 1995
事件Proceedings of the 1995 IEEE International Conference on Communications. Part 1 (of 3) - Seattle, WA, USA
持續時間: 18 6月 199522 6月 1995

Conference

ConferenceProceedings of the 1995 IEEE International Conference on Communications. Part 1 (of 3)
城市Seattle, WA, USA
期間18/06/9522/06/95

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