How do patents' intrinsic properties associate with litigation?

Yang Tai Chou, Hsin-Ning Su

研究成果: Conference contribution同行評審

摘要

this paper aims to devise a novel method for identifying how patent characteristics associated with patent litigation. Large-scale patents granted by the USPTO together with litigation data are converted to items which associations are analyzed by association rule mining. The items considered in this research, for example, Assignee Country, Assignee Country Count, Inventor Country, Inventor Country Count, Number of Patent Reference, Number of Forward Citation, Number of NPR, Number of Foreign Reference, and Numbers of Claim. Obtained with the association relationship depicted by the three variables, 1) Confidence, 2) Support, 3) Lift, an associated network of patents' characteristics can be visually created to understand the landscape of associative relations. The association results uncovered in this research provide a channel to assess whether or not a patent is likely to involve in litigation. Therefore, the influence of patent's intrinsic property hidden in patent's characteristics on the likelihood of infringement can be analyzed.

原文English
主出版物標題PICMET 2017 - Portland International Conference on Management of Engineering and Technology
主出版物子標題Technology Management for the Interconnected World, Proceedings
編輯Timothy R. Anderson, Kiyoshi Niwa, Dundar F. Kocaoglu, Tugrul U. Daim, Dilek Cetindamar Kozanoglu, Gary Perman, Harm-Jan Steenhuis
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1-11
頁數11
ISBN(電子)9781890843366
DOIs
出版狀態Published - 29 11月 2017
事件2017 Portland International Conference on Management of Engineering and Technology, PICMET 2017 - Portland, United States
持續時間: 9 7月 201713 7月 2017

出版系列

名字PICMET 2017 - Portland International Conference on Management of Engineering and Technology: Technology Management for the Interconnected World, Proceedings
2017-January

Conference

Conference2017 Portland International Conference on Management of Engineering and Technology, PICMET 2017
國家/地區United States
城市Portland
期間9/07/1713/07/17

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