HOT-ELECTRON EFFECTS IN MOSFET'S.

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研究成果: Conference article › 同行評審

74 引文斯高帕斯（Scopus）

原文	English
頁（從 - 到）	176-181
頁數	6
期刊	Technical Digest - International Electron Devices Meeting
DOIs	https://doi.org/10.1109/IEDM.1983.190470
出版狀態	Published - 1 12月 1983

存取文件

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title = "HOT-ELECTRON EFFECTS IN MOSFET'S.",

author = "Chen-Ming Hu",

year = "1983",

month = dec,

day = "1",

doi = "10.1109/IEDM.1983.190470",

language = "English",

pages = "176--181",

journal = "Technical Digest - International Electron Devices Meeting",

issn = "0163-1918",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

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AU - Hu, Chen-Ming

PY - 1983/12/1

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DO - 10.1109/IEDM.1983.190470

M3 - Conference article

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EP - 181

JO - Technical Digest - International Electron Devices Meeting

JF - Technical Digest - International Electron Devices Meeting

SN - 0163-1918

ER -