High-speed multilevel wrapped-select-gate SONOS memory using a novel dynamic

Kuan Ti Wang*, Tien-Sheng Chao, Woei Cherng Wu, Tsung Yu Chiang, Yi Hong Wu, Wen Luh Yang, Chien Hsing Lee, Tsung Min Hsieh, Jhyy Cheng Liou, Shen De Wang, Tzu Ping Chen, Chien Hung Chen, Chih Hung Lin, Hwi Huang Chen

*此作品的通信作者

研究成果: Article同行評審

2 引文 斯高帕斯(Scopus)

摘要

A high programming speed with a low-powerconsumption wrapped-select-gate poly-Si-oxide-nitride-oxidesilicon memory is successfully demonstrated using the novel dynamic threshold source-side-injection programming technique. The select gate embedded in such particular memory structure acts like a dynamic MOSFET resulting in programming current (IPGM) that can be enhanced in this DT mode, easily attaining a high programming speed of about 100 ns. It still doubles the memory density by achieving the 2-bit/cell operation with MLC under DT mode.

原文English
頁(從 - 到)659-661
頁數3
期刊Ieee Electron Device Letters
30
發行號6
DOIs
出版狀態Published - 2009

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